Bit Design and Evaluation System

Features:

• Provides a quantitative BIT performance assessment
• Evaluates new and existing BIT designs
• Accommodates variety of BIT designs
• Accommodates various prime indenture levels
• Automatically generates Fault Detection/Fault Isolation (FD/FI) reports

Benefits:

• Provides traceable Built-In-Test (BIT) performance metrics
• Complies with testability, Failure Modes Effect Analysis (FMEA) and other STDs
• Supports concurrent engineering design
• Provides basis for BIT/TPS design verticality
• Generates high quality Data Item (DI) and design review data

BDE Flow Chart

BDE Data Entry:

• User defines prime system hierarchical structure
• Additional failure mode models
• Individual BIT test and failure mode/test correlation
• The model includes failure mode characteristics, failure rates and distribution data
• User data is prompted and checked for accuracy

BDE Assessment Processing:

• BDE evaluates BIT strategy, fault detection and fault isolation.

BDE Output Reports:

• Describes detailed BIT test data
• Illustrates functional and detailed BIT test flow
• Lists failure modes at all indenture levels
• Correlates individual tests with failure modes covered
• Summarizes FD by indenture level
• Summarizes FI by indenture level and distribution